Feature Volatility Assessment

By: Warren Baelen, Yuanfang Cai, Robert Dyer, and Hridesh Rajan

ACM Reference

Baelen, W. et al. 2010. Feature Volatility Assessment. Software Product Lines - 14th International Conference, SPLC, Jeju Island, South Korea (2010), 33–34.

BibTeX Reference

@inproceedings{BaelenCaiDyerRajan2010,
  author = {Warren Baelen and Yuanfang Cai and Robert Dyer and Hridesh Rajan},
  title = {Feature Volatility Assessment},
  booktitle = {Software Product Lines - 14th International Conference, SPLC, Jeju Island, South Korea},
  pages = {33--34},
  year = {2010},
  publisher = {Lancaster University},
  editor = {Goetz Botterweck and Stan Jarzabek and Tomoji Kishi and Jaejoon Lee and Steve Livengood},
}